GENEVA, Aug. 5 -- FUJIREBIO INC. (8-1, Akasaka 1-chome, Minato-ku, Tokyo1070052), 富士レビオ株式会社 (東京都港区赤坂一丁目８番１号) filed a patent application (PCT/JP2025/001580) for "SPECIMEN ANALYSIS DEVICE AND NOZZLE CLEANING METHOD" on Jan 20, 2025. With publication no. WO/2025/159045, the details related to the patent application was published on Jul 31, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KAWATA Akira (c/o FUJIREBIO INC., 8-1, Akasaka 1-c...