GENEVA, Aug. 18 -- FUJIFILM CORPORATION (26-30, Nishiazabu 2-chome, Minato-ku, Tokyo1068620), 富士フイルム株式会社 (東京都港区西麻布２丁目２６番３０号) filed a patent application (PCT/JP2025/000881) for "INSPECTION DEVICE, OPERATION METHOD FOR INSPECTION DEVICE, AND OPERATION PROGRAM FOR INSPECTION DEVICE" on Jan 14, 2025. With publication no. WO/2025/169672, the details related to the patent application was published on Aug 14, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual...