INTERNATIONAL PATENT: FERMION INSTRUMENTS (SHANGHAI) CO., LTD., 费勉仪器科技（上海）有限公司 FILES APPLICATION FOR "ELECTRON BEAM SIZE MEASURING DEVICE AND MEASURING METHOD"

GENEVA, Nov. 2 -- FERMION INSTRUMENTS (SHANGHAI) CO., LTD. (Building 1-10, No. 558, Fulian 2nd Road, Gucun Industrial ParkBaoshan District, Shanghai 201900), 费勉仪器科技（上海）有限公司 (中国上海市宝山区顾村工业园区富联二路558号1-10幢) filed a patent application (PCT/CN2024/118647) for "ELECTRON BEAM SIZE MEASURING DEVICE AND MEASURING METHOD" on Sep 12, 2024. With publication no. WO/2025/222737, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the Internation...