GENEVA, Feb. 17 -- ENEOS CORPORATION (1-2, Otemachi 1-chome, Chiyoda-ku, Tokyo1008162), ＥＮＥＯＳ株式会社 (東京都千代田区大手町一丁目１番２号) filed a patent application (PCT/JP2024/026733) for "MEASURING DEVICE AND DIAGNOSTIC SYSTEM" on Jul 26, 2024. With publication no. WO/2025/033209, the details related to the patent application was published on Feb 13, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): HIRAOKA Takeshi (c/o ENEOS Corpor...