INTERNATIONAL PATENT: DONGFANG JINGYUAN ELECTRON LIMITED, 东方晶源微电子科技（上海）有限公司 FILES APPLICATION FOR "WAFER DEFECT DETECTION METHOD AND APPARATUS"

GENEVA, March 24 -- DONGFANG JINGYUAN ELECTRON LIMITED (3F, 17 Bldg. No.88 Darwin Rd. Zhangjiang Hi-Tech Park, Pudong New AreaShanghai 201203), 东方晶源微电子科技（上海）有限公司 (中国上海市浦东新区张江镇达尔文路88号17栋3楼) filed a patent application (PCT/CN2024/114327) for "WAFER DEFECT DETECTION METHOD AND APPARATUS" on Aug 23, 2024. With publication no. WO/2025/055706, the details related to the patent application was published on Mar 20, 2025.

Notably, the patent application was submitted under the International Patent Cla...