GENEVA, July 3 -- DENKA COMPANY LIMITED (1-1, Nihonbashi-Muromachi 2-chome, Chuo-ku, Tokyo1038338), デンカ株式会社 (東京都中央区日本橋室町二丁目１番１号) filed a patent application (PCT/JP2024/044806) for "METHOD FOR MEASURING TARGET ANTIGEN, AND ANTIBODY, INSOLUBLE PARTICLES AND TARGET ANTIGEN MEASUREMENT KIT USED IN SAID METHOD" on Dec 18, 2024. With publication no. WO/2025/135074, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World...