INTERNATIONAL PATENT: CENTRALESUPELEC, UNIVERSITE PARIS-SACLAY, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE NORMALE SUPERIEURE PARIS-SACLAY FILES APPLICATION FOR "SYSTEM FOR MEASURING A PHOTOINDUCED DEFORMATION OF A SAMPLE"

GENEVA, Dec. 1 -- CENTRALESUPELEC (Plateau de Moulon3 rue Joliot-Curie91190 GIF-SUR-YVETTE), UNIVERSITE PARIS-SACLAY (Batiment Breguet3 rue Joliot-Curie91190 GIF-SUR-YVETTE), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (3 rue Michel-Ange75016 PARIS), ECOLE NORMALE SUPERIEURE PARIS-SACLAY (4 avenue des Sciences91190 GIF-SUR-YVETTE) filed a patent application (PCT/FR2025/050441) for "SYSTEM FOR MEASURING A PHOTOINDUCED DEFORMATION OF A SAMPLE" on May 21, 2025. With publication no. WO/2025/242995, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization ...