INTERNATIONAL PATENT: CANON KABUSHIKI KAISHA, キヤノン株式会社 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD, LITHOGRAPHY DEVICE AND ARTICLE MANUFACTURING METHOD"

GENEVA, May 27 -- CANON KABUSHIKI KAISHA (30-2, Shimomaruko 3-chome, Ohta-ku, Tokyo1468501), キヤノン株式会社 (東京都大田区下丸子３丁目３０番２号) filed a patent application (PCT/JP2024/038943) for "MEASUREMENT DEVICE, MEASUREMENT METHOD, LITHOGRAPHY DEVICE, AND ARTICLE MANUFACTURING METHOD" on Oct 31, 2024. With publication no. WO/2025/105200, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIP...