INTERNATIONAL PATENT: BANOS, PETER FILES APPLICATION FOR "METHODS OF AND DEVICES FOR MONITORING THE EFFECTS OF CELLULAR STRESS AND DAMAGE RESULTING FROM RADIATION EXPOSURE"

GENEVA, Sept. 2 -- BANOS, Peter (547 Roosevelt StreetCoalinga, California 93210) filed a patent application (PCT/US2025/016411) for "METHODS OF AND DEVICES FOR MONITORING THE EFFECTS OF CELLULAR STRESS AND DAMAGE RESULTING FROM RADIATION EXPOSURE" on Feb 19, 2025. With publication no. WO/2025/178913, the details related to the patent application was published on Aug 28, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BURMEISTER, Robert (12520 Saratoga Creek DriveSaratoga, California 95070)

Abstract: Methods of and devices for detecting a measurable characteristic of the gas sample. The me...