INTERNATIONAL PATENT: AUROS TECHNOLOGY, INC., 주식회사 오로스테크놀로지 FILES APPLICATION FOR "OVERLAY MEASUREMENT DEVICE, FOCUS CONTROL METHOD OF OVERLAY MEASUREMENT DEVICE FOR TOOL-INDUCED SHIFT MEASUREMENT AND FOCUS CONTROL PROGRAM OF OVERLAY MEASUREMENT DEVICE FOR TOOL-INDUCED SHIFT MEASUREMENT"

GENEVA, April 7 -- AUROS TECHNOLOGY, INC. (15-23, Dongtansandan 6-gil,Hwaseong-si,Gyeonggi-do 18487), 주식회사 오로스테크놀로지 (경기도화성시동탄산단6길 15-23) filed a patent application (PCT/KR2024/011016) for "OVERLAY MEASUREMENT DEVICE, FOCUS CONTROL METHOD OF OVERLAY MEASUREMENT DEVICE FOR TOOL-INDUCED SHIFT MEASUREMENT, AND FOCUS CONTROL PROGRAM OF OVERLAY MEASUREMENT DEVICE FOR TOOL-INDUCED SHIFT MEASUREMENT" on Jul 29, 2024. With publication no. WO/2025/070988, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the Inter...