INTERNATIONAL PATENT: AUROS TECHNOLOGY, INC., (주) 오로스테크놀로지 FILES APPLICATION FOR "CORRECTION METHOD OF OVERLAY MEASUREMENT DEVICE AND CORRECTION SYSTEM OF OVERLAY MEASUREMENT DEVICE"

GENEVA, Feb. 25 -- AUROS TECHNOLOGY, INC. (15-23 Dongtansandan 6-gil,Hwaseong-si,Gyeonggi-do 18487), (주) 오로스테크놀로지 (경기도화성시동탄산단6길 15-23) filed a patent application (PCT/KR2024/011369) for "CORRECTION METHOD OF OVERLAY MEASUREMENT DEVICE AND CORRECTION SYSTEM OF OVERLAY MEASUREMENT DEVICE" on Aug 02, 2024. With publication no. WO/2025/037806, the details related to the patent application was published on Feb 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s...