INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "APPARATUS AND METHOD OF MEASURING FEATURES IN STACKED DIES"

GENEVA, Feb. 10 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/037271) for "APPARATUS AND METHOD OF MEASURING FEATURES IN STACKED DIES" on Jul 11, 2025. With publication no. WO/2026/029949, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HUNG, Raymond Hoiman (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), CHONG, Yau Loong (c/o Applied Materials South East Asia Pte. Ltd.8 Upper Changi Road NorthSingapore ...