GENEVA, June 17 -- ADVANTEST CORPORATION (1-6-2, Marunouchi, Chiyoda-ku, Tokyo1000005), 株式会社アドバンテスト (東京都千代田区丸の内１丁目６番２号) filed a patent application (PCT/JP2024/037707) for "TEST APPARATUS AND TEST METHOD" on Oct 23, 2024. With publication no. WO/2025/121020, the details related to the patent application was published on Jun 12, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): CHIBA Noriaki (c/o ADVANT...