INTERNATIONAL PATENT: ADVANTEST CORPORATION, 株式会社アドバンテスト, THE UNIVERSITY OF TOKYO, 国立大学法人　東京大学 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD AND MEASUREMENT PROGRAM"

Posted On: 2025-11-10

GENEVA, Nov. 10 -- ADVANTEST CORPORATION (1-6-2, Marunouchi, Chiyoda-ku, Tokyo1000005), 株式会社アドバンテスト (東京都千代田区丸の内１丁目６番２号), THE UNIVERSITY OF TOKYO (3-1, Hongo 7-chome, Bunkyo-ku, Tokyo1138654), 国立大学法人　東京大学 (東京都文京区本郷七丁目３番１号) filed a patent application (PCT/JP2024/016693) for "MEASUREMENT DEVICE, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM" on Apr 30, 2024. With publication...

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INTERNATIONAL PATENT: ADVANTEST CORPORATION, 株式会社アドバンテスト, THE UNIVERSITY OF TOKYO, 国立大学法人　東京大学 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD AND MEASUREMENT PROGRAM"

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INTERNATIONAL PATENT: ADVANTEST CORPORATION, 株式会社アドバンテスト, THE UNIVERSITY OF TOKYO, 国立大学法人 東京大学 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD AND MEASUREMENT PROGRAM"

INTERNATIONAL PATENT: ADVANTEST CORPORATION, 株式会社アドバンテスト, THE UNIVERSITY OF TOKYO, 国立大学法人　東京大学 FILES APPLICATION FOR "MEASUREMENT DEVICE, MEASUREMENT METHOD AND MEASUREMENT PROGRAM"