INTERNATIONAL PATENT: ACM RESEARCH (SHANGHAI),INC., 盛美半导体设备（上海）股份有限公司, ACM RESEARCH (LINGANG),INC., 盛帷半导体设备（上海）有限公司 FILES APPLICATION FOR "OPTICAL MEASUREMENT APPARATUS FOR MEASURING THICKNESS OF DEPOSITED FILM LAYER AND FURNACE TUBE DEVICE AND CONTROL METHOD"

GENEVA, Feb. 3 -- ACM RESEARCH (SHANGHAI) , INC. (Building 4, No. 1690 Cai Lun Road, China (shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201203), 盛美半导体设备（上海）股份有限公司 (中国上海市浦东新区中国（上海）自由贸易试验区蔡伦路1690号第4幢), ACM RESEARCH (LINGANG) , INC. (Building C, No. 888 Huanhu West Second Road, Nanhui New Town, Lin-gang Special Area Of China (shanghai) Pilot Free Trade ZonePudong New Area, Shanghai 201303), 盛帷半导...