Intellectual Property India Publishes Patent Application for 'System For Measuring A Central Wavelength Of A Spectral Line With High Accuracy And Associated Method' Filed by Commissariat A L'Energie Atomique Et Aux Energies Alternatives

MUMBAI, India, April 11 -- Intellectual Property India has published a patent application (202517025844 A) filed by Commissariat A L'Energie Atomique Et Aux Energies Alternatives, Paris, on March 21, for 'system for measuring a central wavelength of a spectral line with high accuracy and associated method.'

Inventor(s) include Sirven, Jean-Baptiste; Touchet, Kevin; and Chartier, Frederic.

The application for the patent was published on April 11, under issue no. 15/2025.

According to the abstract released by the Intellectual Property India: "Disclosed is a system (10) for measuring a central wavelength of interest (?c) of a spectral line of interest (RSe) measured by a spectrometer, the system comprising: - a detecting system comprising a...