MUMBAI, India, March 28 -- Intellectual Property India has published a patent application (202517022001 A) filed by Lenovo (BEIJING) Limited, Beijing, on March 11, for 'method and apparatus of supporting quality of experience (qoe) measurement collection.'

Inventor(s) include Dai Mingzeng; Choi Hyung Nam; Zhang Congchi; Wu Lianhai; Yan Le; and Yang Shuigen.

The application for the patent was published on March 28, under issue no. 13/2025.

According to the abstract released by the Intellectual Property India: "A method of supporting quality of experience (QoE) measurement collection may include: receiving first QoE configuration information from a first RAN node; receiving second QoE configuration information from a second RAN node; and t...