ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,429, issued on May 12, was assigned to SHIN-ETSU CHEMICAL Co. LTD. (Tokyo). "Resist composition and pattern forming process" was invented by... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,430, issued on May 12, was assigned to DuPont Specialty Materials Korea Ltd. (South Korea). "Colored photosensitive resin composition and mu... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,431, issued on May 12, was assigned to NISSAN CHEMICAL Corp. (Tokyo). "EUV resist underlayer film-forming composition" was invented by Shou ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,432, issued on May 12, was assigned to Tokyo Electron Ltd. (Tokyo). "Methods of forming patterns" was invented by Daniel Fulford (Cohoes, N.... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,433, issued on May 12, was assigned to NIKON Corp. (Tokyo). "Spatial light modulation unit and exposure apparatus" was invented by Yasuhito ... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,434, issued on May 12, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Lithography scanner throughput" w... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,435, issued on May 12, was assigned to GUDENG PRECISION INDUSTRIAL Co. LTD. (New Taipei, Taiwan). "Reticle storage cabinet system and method... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,436, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Lithography apparatus" was invented by Sung Yo... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,437, issued on May 12, was assigned to Tokyo Electron Ltd. (Tokyo). "Substrate processing apparatus and substrate processing method" was inv... Read More
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,438, issued on May 12, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Interface plate, inspection system and method of ins... Read More