INTERNATIONAL PATENT: SUMITOMO SEIKA CHEMICALS CO., LTD., 住友精化株式会社 FILES APPLICATION FOR "SECONDARY BATTERY BINDER, SLURRY, ELECTRODE, SECONDARY BATTERY PRODUCTION METHOD AND SECONDARY BATTERY"

GENEVA, March 3 -- SUMITOMO SEIKA CHEMICALS CO., LTD. (346-1, Miyanishi, Harima-cho, Kako-gun, Hyogo6750145), 住友精化株式会社 (兵庫県... Read More

INTERNATIONAL PATENT: FUJIFILM CORPORATION, 富士フイルム株式会社 FILES APPLICATION FOR "PHOTODETECTION ELEMENT AND IMAGE SENSOR"

GENEVA, March 3 -- FUJIFILM CORPORATION (26-30, Nishiazabu 2-chome, Minato-ku, Tokyo1068620), 富士フイルム株式会社 (東京都... Read More

INTERNATIONAL PATENT: MITSUBISHI HEAVY INDUSTRIES, LTD., 三菱重工業株式会社, MITSUBISHI POWER, LTD., 三菱パワー株式会社 FILES APPLICATION FOR "TURBINE STATIONARY BLADE AND GAS TURBINE"

GENEVA, March 3 -- MITSUBISHI HEAVY INDUSTRIES, LTD. (2-3, Marunouchi 3-Chome, Chiyoda-ku, Tokyo1008332), 三菱重工業株式会社 (東京&#37... Read More

INTERNATIONAL PATENT: JFE STEEL CORPORATION, ＪＦＥスチール株式会社 FILES APPLICATION FOR "STEEL, STEEL COMPONENT AND METHOD FOR PRODUCING STEEL"

GENEVA, March 3 -- JFE STEEL CORPORATION (2-3, Uchisaiwai-cho 2-chome, Chiyoda-ku, Tokyo1000011), ＪＦＥスチール株式会社 (東&#20... Read More

INTERNATIONAL PATENT: TORAY INDUSTRIES, INC., 東レ株式会社 FILES APPLICATION FOR "PROJECTION IMAGE DISPLAY MEMBER AND HEAD-UP DISPLAY SYSTEM"

GENEVA, March 3 -- TORAY INDUSTRIES, INC. (1-1, Nihonbashi-Muromachi 2-chome, Chuo-ku, Tokyo1038666), 東レ株式会社 (東京都中央区... Read More

INTERNATIONAL PATENT: DENSO CORPORATION, 株式会社デンソー FILES APPLICATION FOR "CRIME PREVENTION DEVICE, CONTROL METHOD FOR CRIME PREVENTION DEVICE AND PROGRAM FOR CRIME PREVENTION DEVICE"

GENEVA, March 3 -- DENSO CORPORATION (1-1, Showa-cho, Kariya-city, Aichi4488661), 株式会社デンソー (愛知県刈谷市&#26... Read More

INTERNATIONAL PATENT: TOPPAN HOLDINGS INC., ＴＯＰＰＡＮホールディングス株式会社 FILES APPLICATION FOR "LAMINATE, METHOD FOR PRODUCING LAMINATE AND PACKAGING BAG"

GENEVA, March 3 -- TOPPAN HOLDINGS INC. (5-1, Taito 1-chome, Taito-ku, Tokyo1100016), ＴＯＰＰＡＮホールディングス&#... Read More

INTERNATIONAL PATENT: SHIN-ETSU HANDOTAI CO., LTD., 信越半導体株式会社 FILES APPLICATION FOR "METHOD FOR EVALUATING SURFACE DEFECT OF SIGE SUBSTRATE"

GENEVA, March 3 -- SHIN-ETSU HANDOTAI CO., LTD. (2-1, Ohtemachi 2-chome, Chiyoda-ku, Tokyo1000004), 信越半導体株式会社 (東京都&#... Read More

INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "PICK-UP DEVICE, BONDING DEVICE, PICK-UP METHOD AND BONDING METHOD"

GENEVA, March 3 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東&#2... Read More

INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "SUBSTRATE PROCESSING DEVICE"

GENEVA, March 3 -- TOKYO ELECTRON LIMITED (3-1 Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東&#20... Read More

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