ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,275, issued on July 7, was assigned to Solaredge Technologies Ltd. (Herzeliya, Israel). "Pyrotechnic fuse" was invented by Yuval Keren (Reho... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,276, issued on July 7, was assigned to AWEXOME RAY INC. (Anyang-si, South Korea). "Emitter and field emission assembly including the same" w... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,277, issued on July 7, was assigned to CANON ELECTRON TUBES & DEVICES Co. LTD. (Otawara-shi, Japan). "Sliding bearing unit and rotating anod... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,278, issued on July 7, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Charged particle apparatus and method" was invented ... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,279, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Electron microscope" was invented by Michiko Suzuki (Tokyo) and Yud... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,280, issued on July 7, was assigned to AIRSEM TECHNOLOGIES LTD. (Rehovot, Israel). "Charged particle beam devices and membrane assemblies us... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,281, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Sample holder and electron microscope" was invented by Yuji Asakura... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,282, issued on July 7, was assigned to Waviks Inc. (Dallas). "Optical probe system for the electron microscope" was invented by Thomas M. Mo... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,283, issued on July 7, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Method for particle beam-induced processing of a defect o... Read More
ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,284, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Defect inspection apparatus" was invented by Yasuhiro Yoshida (Toky... Read More