US Patent Issued to Solaredge Technologies on July 7 for "Pyrotechnic fuse" (Israeli Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,275, issued on July 7, was assigned to Solaredge Technologies Ltd. (Herzeliya, Israel). "Pyrotechnic fuse" was invented by Yuval Keren (Reho... Read More

US Patent Issued to AWEXOME RAY on July 7 for "Emitter and field emission assembly including the same" (South Korean Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,276, issued on July 7, was assigned to AWEXOME RAY INC. (Anyang-si, South Korea). "Emitter and field emission assembly including the same" w... Read More

US Patent Issued to CANON ELECTRON TUBES & DEVICES on July 7 for "Sliding bearing unit and rotating anode X-ray tube" (Japanese Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,277, issued on July 7, was assigned to CANON ELECTRON TUBES & DEVICES Co. LTD. (Otawara-shi, Japan). "Sliding bearing unit and rotating anod... Read More

US Patent Issued to ASML Netherlands on July 7 for "Charged particle apparatus and method" (Dutch Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,278, issued on July 7, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Charged particle apparatus and method" was invented ... Read More

US Patent Issued to Hitachi High-Tech on July 7 for "Electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,279, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Electron microscope" was invented by Michiko Suzuki (Tokyo) and Yud... Read More

US Patent Issued to AIRSEM TECHNOLOGIES on July 7 for "Charged particle beam devices and membrane assemblies useful therein" (Israeli Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,280, issued on July 7, was assigned to AIRSEM TECHNOLOGIES LTD. (Rehovot, Israel). "Charged particle beam devices and membrane assemblies us... Read More

US Patent Issued to Hitachi High-Tech on July 7 for "Sample holder and electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,281, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Sample holder and electron microscope" was invented by Yuji Asakura... Read More

US Patent Issued to Waviks on July 7 for "Optical probe system for the electron microscope" (Texas Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,282, issued on July 7, was assigned to Waviks Inc. (Dallas). "Optical probe system for the electron microscope" was invented by Thomas M. Mo... Read More

US Patent Issued to Carl Zeiss SMT on July 7 for "Method for particle beam-induced processing of a defect of a microlithographic photomask" (German Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,283, issued on July 7, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "Method for particle beam-induced processing of a defect o... Read More

US Patent Issued to Hitachi High-Tech on July 7 for "Defect inspection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,284, issued on July 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Defect inspection apparatus" was invented by Yasuhiro Yoshida (Toky... Read More

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